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刚接触DSP28335，CCS5.3编程环境，XDS100v2下载器，同样的程序和配置连接下载一个老板没有问题，现在项目需要用了一个新板，但是连接测试错误，错误信息如下，求高手指教。6 ?0 Q& [; A& X. ^4 @
[Start]
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Execute the command:
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8 S+ h) Q4 _. m8 H! |4 }%ccs_base%/common/uscif/dbgjtag -f %boarddatafile% -rv -o -F inform,logfile=yes -S pathlength -S integrity
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[Result]" T( |# { b- @! Z s* r
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2 e3 u9 e& U* U, ~6 D- |) d2 T-----[Print the board config pathname(s)]------------------------------------- C5 i5 D+ Q8 A/ i
; h- \0 B+ w! |C:\Users\ADMINI~1\AppData\Local\.ti\4084209646\8 {" ^8 H$ ?5 K3 b" h! X6 \
0\0\BrdDat\testBoard.dat
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( F, g% N% A ^5 i* Z-----[Print the reset-command software log-file]-----------------------------; ?$ j5 F* c6 ]% h2 ]; S
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This utility has selected a 100- or 510-class product." m. P& `% u; S% z7 A
This utility will load the adapter 'jioserdesusb.dll'.
0 b4 Z& O# v1 SThe library build date was 'Oct 3 2012'.; y! M1 U9 \$ s H! [+ z
The library build time was '21:58:41'.
( s$ ^) b8 |. q0 T: k4 v1 w, {The library package version is '5.0.872.0'.
0 L5 o1 Y: q4 S5 {The library component version is '35.34.40.0'.; m9 B* |3 z& ?" ~2 ^5 G% C
The controller does not use a programmable FPGA.* g9 s6 A* P4 P' h8 q% B5 [3 X+ ^3 G! t7 j
The controller has a version number of '4' (0x00000004)., j* z% p# T' H) M
The controller has an insertion length of '0' (0x00000000).
* U( L. s% U/ z4 T& X) kThis utility will attempt to reset the controller.1 y {" v, f& ?6 A+ l9 t
This utility has successfully reset the controller.0 ?. D: B' c. H0 z) e9 D
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-----[Print the reset-command hardware log-file]-----------------------------
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The scan-path will be reset by toggling the JTAG TRST signal.
8 ^4 r! m+ b/ Q: ?( V# G+ \: ~The controller is the FTDI FT2232 with USB inteRFace.( v" I) N" i& n( z- ?* j5 a; ~
The link from controller to target is direct (without cable).2 v E8 S4 O2 S3 J5 M2 \
The software is configured for FTDI FT2232 features.& G8 X7 ^. }8 D' p/ R8 _
The controller cannot monitor the value on the EMU[0] pin.+ Z+ i, b' Z% ~, B# H' @8 ~
The controller cannot monitor the value on the EMU[1] pin.
/ S( a8 M4 b0 W- u! G7 iThe controller cannot control the timing on output pins.0 d2 {+ x; A8 e& j" _; l) F
The controller cannot control the timing on input pins.- F7 X B: J1 D
The scan-path link-delay has been set to exactly '0' (0x0000).8 P" W( e6 p5 i* `3 `
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-----[The log-file for the JTAG TCLK output generated from the PLL]----------
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There is no hardware for programming the JTAG TCLK frequency.# d/ ^5 E% T3 Z2 a& N
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-----[Measure the source and frequency of the final JTAG TCLKR input]--------
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There is no hardware for measuring the JTAG TCLK frequency.
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/ Q! E: U0 A- ]2 \1 R1 M0 `* }, d J! c-----[Perform the standard path-length test on the JTAG IR and DR]-----------2 P) r6 l+ b8 W0 Y9 \
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This path-length test uses blocks of 512 32-bit words.# ^) e& N/ K' u* M0 `! f9 d* e2 j; F' D
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The test for the JTAG IR instruction path-length faiLED.0 J; O6 E# b/ [- X( y
The many-ones then many-zeros tested length was 6 bits.
7 k0 I3 r# J# i# P6 [The many-zeros then many-ones tested length was -16352 bits.
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* v5 N+ @1 G% @The test for the JTAG DR bypass path-length failed.
( Y# J: V3 [7 V" T& TThe many-ones then many-zeros tested length was 8 bits.
' k* Y- {" A- Q- y( {3 X& b: J0 \The many-zeros then many-ones tested length was -16352 bits.
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- d( A3 u" \5 [& K# X/ q-----[Perform the Integrity scan-test on the JTAG IR]------------------------0 b, w N) M2 `" y2 V. E7 k
! v1 h. ~7 r% u4 L# T$ n: y) f$ cThis test will use blocks of 512 32-bit words.
+ m. E8 A+ o, N7 G( @3 X' rThis test will be applied just once., |3 }- t) Q$ k6 Q& T* i9 z) q
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Do a test using 0xFFFFFFFF.
! T& _0 Q; S2 ?5 D# _* i" c$ eScan tests: 1, skipped: 0, failed: 04 n, p7 e# j8 k% t4 D5 r
Do a test using 0x00000000.
7 d, \! G3 k& F" a" c) fTest 2 Word 0: scanned out 0x00000000 and scanned in 0x000000FF.
9 ~+ B1 T+ A1 ?Scan tests: 2, skipped: 0, failed: 1; q3 L' Z& d: w" @; Z- s: w
Do a test using 0xFE03E0E2.
% ]6 a/ ^0 z; z; e: L2 tTest 3 Word 0: scanned out 0xFE03E0E2 and scanned in 0xFC1FE7FF. N7 M9 g, _7 v' X( E" b$ N5 O
Test 3 Word 1: scanned out 0xFE03E0E2 and scanned in 0xFC1FC7FF." f2 C' j) }7 V& a5 J- ?
Test 3 Word 2: scanned out 0xFE03E0E2 and scanned in 0xFC1FE7FF.; Q) _/ D$ H6 c' B8 u
Test 3 Word 3: scanned out 0xFE03E0E2 and scanned in 0xFC1FE7EF.
7 j; Z3 V& s2 Z6 n rTest 3 Word 4: scanned out 0xFE03E0E2 and scanned in 0xFC1FC7FF.2 {. m) n$ W- O9 b
Test 3 Word 5: scanned out 0xFE03E0E2 and scanned in 0xFC1FC3FF.
/ X/ j& {5 T) h7 |. H; g. Y0 ~Test 3 Word 6: scanned out 0xFE03E0E2 and scanned in 0xFC0FE7FF.
: r( [! E/ z! J3 l* B4 N) KThe details of the first 8 errors have been provided.) I% P0 P6 f) i
The utility will now report only the count of failed tests.0 v- r* h6 U# X6 E
Scan tests: 3, skipped: 0, failed: 2" B& |( } p% c
Do a test using 0x01FC1F1D.
, T3 t8 F- ?1 yScan tests: 4, skipped: 0, failed: 3/ Q1 G3 D2 V4 G# K
Do a test using 0x5533CCAA.
D D5 f/ T, vScan tests: 5, skipped: 0, failed: 4. `. c- I3 W0 E
Do a test using 0xAACC3355.
7 s3 W: B: V% Z; nScan tests: 6, skipped: 0, failed: 5( d: r {" c. ]3 A) A/ \% l( j
Some of the values were corrupted - 66.7 percent.
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3 R( T; {* k: {+ C6 ^' [; H2 aThe JTAG IR Integrity scan-test has failed.
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* A2 h6 e0 c% A-----[Perform the Integrity scan-test on the JTAG DR]------------------------
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This test will use blocks of 512 32-bit words.
2 n2 k; o- p( L4 Q2 P* FThis test will be applied just once.5 T9 e( P( O# D
p9 g; C* b; R+ t8 I9 rDo a test using 0xFFFFFFFF.) ~: m+ L7 A+ s4 C; d' K. x& N
Scan tests: 1, skipped: 0, failed: 0
! H. w5 ~4 Q2 _: {/ L6 B( [Do a test using 0x00000000.
# d* O# B, l/ ?% u/ O9 G3 lTest 2 Word 0: scanned out 0x00000000 and scanned in 0x0000007F./ n6 v5 z1 P# a8 }
Scan tests: 2, skipped: 0, failed: 1- `, O; J C2 D: ?% ~! e' G
Do a test using 0xFE03E0E2.) c/ K4 B( N- u3 b) K$ \9 S
Test 3 Word 0: scanned out 0xFE03E0E2 and scanned in 0xFC1FE7FF.
$ X+ a; S P5 `; E: D) B+ BTest 3 Word 1: scanned out 0xFE03E0E2 and scanned in 0xFC3FE7FF.
) O2 h0 W# ]% v, z; [. ~Test 3 Word 2: scanned out 0xFE03E0E2 and scanned in 0xFC0FE7FF.; q3 p- P. n/ p7 R f
Test 3 Word 3: scanned out 0xFE03E0E2 and scanned in 0xFC3FE7FF.4 ~3 P5 h( E* o
Test 3 Word 4: scanned out 0xFE03E0E2 and scanned in 0xFC1FC7FF.' W, t/ e/ ^$ `6 r/ ]4 @* D7 A
Test 3 Word 5: scanned out 0xFE03E0E2 and scanned in 0xFE1FE7FF.
, S7 s4 N% M$ @- ~5 W& CTest 3 Word 6: scanned out 0xFE03E0E2 and scanned in 0xFC1FE7FF.4 C# F$ X9 [+ g* m& w9 f
The details of the first 8 errors have been provided.
, _4 E( k, Z! K! E* pThe utility will now report only the count of failed tests.* ^3 t' l* ~5 X8 z# B
Scan tests: 3, skipped: 0, failed: 2
( [" \( q: }$ X6 A" Y5 @$ NDo a test using 0x01FC1F1D.
- R# j- E/ }+ S7 w) [# pScan tests: 4, skipped: 0, failed: 37 j' F' d) n# n% W$ z: C
Do a test using 0x5533CCAA.( d, G' _: \, @, h
Scan tests: 5, skipped: 0, failed: 4; f* ^5 A6 c7 m ^# b
Do a test using 0xAACC3355./ [0 v4 Z/ X, g% X7 m) H V8 O
Scan tests: 6, skipped: 0, failed: 5
5 |- \; W* ^2 Y$ M" ]5 wSome of the values were corrupted - 66.7 percent.
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1 w! e7 s3 Q+ p0 v }5 Y% M" d/ LThe JTAG DR Integrity scan-test has failed.
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发表于 2021-12-23 10:34
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