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刚接触DSP28335，CCS5.3编程环境，XDS100v2下载器，同样的程序和配置连接下载一个老板没有问题，现在项目需要用了一个新板，但是连接测试错误，错误信息如下，求高手指教。
s' [% ~' ^3 @0 r m, w[Start]" W2 e3 E) E# \
; l: n% g% c7 a/ q- }( {) Y3 MExecute the command:
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%ccs_base%/common/uscif/dbgjtag -f %boarddatafile% -rv -o -F inform,logfile=yes -S pathlength -S integrity* [7 Y. g x- G9 o( O# h
% }5 H, j: v: S* ]3 J) F3 \
[Result]6 G0 x* l/ F m. x6 J& N' N/ C- S
8 q# o1 x1 W& Z: z
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-----[Print the board config pathname(s)]------------------------------------/ r, Y+ L4 \, i i) M3 y
* q8 g! Y# f5 [- n2 Z) m
C:\Users\ADMINI~1\AppData\Local\.ti\4084209646\
- C! f8 a+ f) ^5 o4 p 0\0\BrdDat\testBoard.dat, y( K) E% K' E+ k) w
! \- l8 x; u0 g+ ~0 E- W- @
-----[Print the reset-command software log-file]-----------------------------' W/ K9 p, j. e. }. P
. S+ ?+ d# Z6 z% t- I. \# ZThis utility has selected a 100- or 510-class product.
6 |: P6 J7 c/ P# E! tThis utility will load the adapter 'jioserdesusb.dll'.
# e4 p, [" q& f8 |! U/ m0 d7 MThe library build date was 'Oct 3 2012'.. }2 u5 X5 T; s: P5 b! W* u) D
The library build time was '21:58:41'.* K$ e# s; ?+ ]. Z' }1 n
The library package version is '5.0.872.0'.
0 R4 _0 [" |% z VThe library component version is '35.34.40.0'.* x5 E, q& X# x1 q
The controller does not use a programmable FPGA.
+ ]' K* [: k8 E5 |7 S" e- l" {0 {The controller has a version number of '4' (0x00000004).
9 N1 Y( e% e; D& \The controller has an insertion length of '0' (0x00000000).& b( R7 k/ T8 t
This utility will attempt to reset the controller.8 k( k9 y5 I# V1 M8 P) p/ t
This utility has successfully reset the controller.- L; h: R) ~: {* b& r: ^
# q3 c0 Z; \0 `+ v. A x1 X ?-----[Print the reset-command hardware log-file]-----------------------------3 w! |( |# F0 g f& M6 `
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The scan-path will be reset by toggling the JTAG TRST signal." h3 H7 z+ i$ x1 r
The controller is the FTDI FT2232 with USB inteRFace.1 m' Z# M$ T9 N( ?! [! `
The link from controller to target is direct (without cable).: z# M) D) z2 o9 G) s
The software is configured for FTDI FT2232 features.
: C+ y: z2 f E( w1 r0 oThe controller cannot monitor the value on the EMU[0] pin.
. ^: ?5 _3 z0 [The controller cannot monitor the value on the EMU[1] pin.
; [, D: `5 \4 z7 o! `1 N" y/ t" pThe controller cannot control the timing on output pins., M: Q: W/ m$ m! J4 D) e
The controller cannot control the timing on input pins.8 [, g6 L5 [ X+ L& x) r& ]
The scan-path link-delay has been set to exactly '0' (0x0000).
3 Z( G/ r3 M# J! R$ D
) J! k1 R4 T6 E; @" A1 f-----[The log-file for the JTAG TCLK output generated from the PLL]----------
H. @# w! A* j$ M3 [; \( d
3 \' z" q# ?4 E2 }. u* L4 o- v. |There is no hardware for programming the JTAG TCLK frequency.: N/ C; u- u, o
6 i5 x. d2 f. L8 M5 {6 X% K-----[Measure the source and frequency of the final JTAG TCLKR input]--------
' \; a9 J8 E; e7 N, Q
( G; n3 z6 G0 C4 uThere is no hardware for measuring the JTAG TCLK frequency. @/ G. \ m+ V" b+ _
7 P* {: {1 @3 i1 m) N; [-----[Perform the standard path-length test on the JTAG IR and DR]-----------
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This path-length test uses blocks of 512 32-bit words.! }& q3 u4 \$ |0 R6 Z. f1 F L. o$ |$ i
X, J5 V( v( e4 Z LThe test for the JTAG IR instruction path-length faiLED.
( v* ?) X- A# ^0 aThe many-ones then many-zeros tested length was 6 bits.
/ O7 l! x9 y. j1 E- A- l3 |The many-zeros then many-ones tested length was -16352 bits.
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The test for the JTAG DR bypass path-length failed.5 y) e0 R! Y; |$ R( u
The many-ones then many-zeros tested length was 8 bits." | w% C; T4 x0 g+ Z) r; Q
The many-zeros then many-ones tested length was -16352 bits.: I; t8 a' h* g/ O3 _5 Q' b
! O7 I; R/ I8 N5 G3 ]5 {-----[Perform the Integrity scan-test on the JTAG IR]------------------------
$ g- t" N) T3 z- l7 P. ^
. h/ r5 ]# n6 p e+ N5 GThis test will use blocks of 512 32-bit words.( | Z* M9 @) _
This test will be applied just once.
$ q7 N0 {& v5 L' Y0 H. A5 k
% }, t3 C9 ^$ {: C8 ~Do a test using 0xFFFFFFFF.$ x5 @. g: Q w3 _ w- p9 M ~
Scan tests: 1, skipped: 0, failed: 04 ]/ H9 @+ P$ u7 ?
Do a test using 0x00000000.6 R# g5 ]0 h7 ~" G2 K
Test 2 Word 0: scanned out 0x00000000 and scanned in 0x000000FF.! [9 ~5 h( l5 ~" |; c! x
Scan tests: 2, skipped: 0, failed: 13 U; ?: O% p- ^! S+ H* j
Do a test using 0xFE03E0E2.+ U \# |, i: L& d+ p! W/ a
Test 3 Word 0: scanned out 0xFE03E0E2 and scanned in 0xFC1FE7FF./ b8 W. @2 x. \) a# K
Test 3 Word 1: scanned out 0xFE03E0E2 and scanned in 0xFC1FC7FF.8 n$ b& w* }4 [3 K
Test 3 Word 2: scanned out 0xFE03E0E2 and scanned in 0xFC1FE7FF.
: F8 }; |" i4 D* v* uTest 3 Word 3: scanned out 0xFE03E0E2 and scanned in 0xFC1FE7EF.
* B2 w% ~: W7 p; C9 T1 |# XTest 3 Word 4: scanned out 0xFE03E0E2 and scanned in 0xFC1FC7FF.7 \* }- \. Y) z
Test 3 Word 5: scanned out 0xFE03E0E2 and scanned in 0xFC1FC3FF." q3 J8 j7 M6 v+ u, _% r
Test 3 Word 6: scanned out 0xFE03E0E2 and scanned in 0xFC0FE7FF.
1 N2 Q, n2 m" k+ nThe details of the first 8 errors have been provided.
, G2 a* h$ Q: l) e* B2 cThe utility will now report only the count of failed tests.1 e( w" s7 C2 g) x N
Scan tests: 3, skipped: 0, failed: 2
; W& S7 V, q. F9 P: Z, W9 S' KDo a test using 0x01FC1F1D.) } Y6 j U* g& _) T- C
Scan tests: 4, skipped: 0, failed: 3
( C5 }" }7 t- g9 B9 z$ t( h3 K9 hDo a test using 0x5533CCAA.2 N& t/ h5 P: @2 U0 \1 G# N
Scan tests: 5, skipped: 0, failed: 4
, X2 @# S$ {) RDo a test using 0xAACC3355.* s$ U% ~3 U% L% J
Scan tests: 6, skipped: 0, failed: 5
d3 x8 X+ ^/ s' X! Y7 X0 G1 wSome of the values were corrupted - 66.7 percent.
4 u' y! Y% T. [: C& }: I. Z j0 Y% y7 H: B
The JTAG IR Integrity scan-test has failed.
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# S, F$ |. o$ N6 |4 j* z7 Z, D-----[Perform the Integrity scan-test on the JTAG DR]------------------------
% j) `2 V1 B* d. @! p
; v2 }4 R3 t# P* `& Z- S' L' uThis test will use blocks of 512 32-bit words.$ A1 X2 g |" e: v
This test will be applied just once.! w w0 j) ^4 }$ b
* z* z. b) k4 a0 pDo a test using 0xFFFFFFFF.
/ e# ]% {. \0 D! F2 YScan tests: 1, skipped: 0, failed: 0
% w! d: v$ c' x4 e! D- SDo a test using 0x00000000.1 q4 ^1 N. f4 Y' `7 f( Y
Test 2 Word 0: scanned out 0x00000000 and scanned in 0x0000007F.
, I8 Q( M# e+ H( N6 l5 n; ^Scan tests: 2, skipped: 0, failed: 18 x z! V) w4 N6 W z! g
Do a test using 0xFE03E0E2.6 N: o9 u# S$ }0 T6 U* {
Test 3 Word 0: scanned out 0xFE03E0E2 and scanned in 0xFC1FE7FF./ y r: @) e4 \3 }; H5 v/ H
Test 3 Word 1: scanned out 0xFE03E0E2 and scanned in 0xFC3FE7FF.9 a6 Y! l! N7 [4 g& f
Test 3 Word 2: scanned out 0xFE03E0E2 and scanned in 0xFC0FE7FF.
& p- m. Q* e9 aTest 3 Word 3: scanned out 0xFE03E0E2 and scanned in 0xFC3FE7FF.% R4 W* u/ `' H4 ]6 Y3 I
Test 3 Word 4: scanned out 0xFE03E0E2 and scanned in 0xFC1FC7FF.& ?& Q6 W* j2 I
Test 3 Word 5: scanned out 0xFE03E0E2 and scanned in 0xFE1FE7FF.8 l' k Q1 b) s# C/ i2 z7 V
Test 3 Word 6: scanned out 0xFE03E0E2 and scanned in 0xFC1FE7FF.
$ |2 A' O( u& X5 ^; b! IThe details of the first 8 errors have been provided.- A! i9 ^) f0 m+ a
The utility will now report only the count of failed tests.4 i5 v1 a$ @7 [& P, r
Scan tests: 3, skipped: 0, failed: 2
9 r" Y$ N) C9 G6 Q4 Z* aDo a test using 0x01FC1F1D.1 K' q' f5 i. f2 S& f9 X. c" K
Scan tests: 4, skipped: 0, failed: 3, \! P# f$ h/ L& C E
Do a test using 0x5533CCAA.
( r0 |0 @/ N' F/ C% u! a6 g& o7 M; hScan tests: 5, skipped: 0, failed: 4 o9 ~3 }; g/ n: r7 R E2 ~- Q- H9 L
Do a test using 0xAACC3355.% W1 u' y0 l( B% N
Scan tests: 6, skipped: 0, failed: 5+ h! E& l# u: ` M; l0 U
Some of the values were corrupted - 66.7 percent.
3 I" N* D; A$ ?- u% S4 w* X2 b- c$ D$ h0 P
The JTAG DR Integrity scan-test has failed.
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发表于 2021-12-23 10:34
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