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AGM CPLD Family

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发表于 2019-8-3 09:00 | 只看该作者 |只看大图 回帖奖励 |倒序浏览 |阅读模式

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General Description
) T% r8 @1 n  H% b# eAGM cpld family provides low-cost instant-on, non-volatile CPLDs, with densities from 256, 272 to 576 logic LUTs and
) s3 m7 ~- i8 M; qnon-volatile flash storage of 256Kbits. The devices offer up to 144 I/O pins featuring with a user flash memory (UFM), and
( H4 Q. L6 C0 q0 t4 fin-system programming. The devices are designed to reduce cost and power while providing programmable solutions for a# e" i: ^! E6 k1 Z* r1 K/ X
wide range of applications.0 z/ h/ e' d0 p1 ?- J  z
Features* W9 k1 T. i& _' r
 Low-Cost and low-power CPLD/ k2 p5 Z. P7 _5 l; D' o. e
 Instant-on, non-volatile Compatible FPGA architecture.6 Y( Y2 B% J, v8 Q" a
 Up to 4 global clock lines in the global clock network that drive throughout the entire device.
7 g# M/ S# X& {: o! s/ R1 d Provides programmable fast propagation delay and clock-to-output times.
* t5 m# c% m! f/ q1 V4 [; t Provides PLL per device provide clock multiplication and phaseshifting (AG256 has no PLL)., s7 O% [1 T$ }2 D
 UFM supports non-volatile storage up to 256 Kbits.- a& h. @' L, B! f* l& }( D
 Supports 3.3-V, 2.5-V, 1.8-V, and 1.5-V logic level& ~. }+ A7 {& o/ |* ]# W
 Programmable slew rate, drive strength, bus-hold, programmable pull-up resistors, open-drain output, Schmitt triggers and programmable input delay.& r$ _0 ?. o+ B: N% P$ k' C: `
 Built-in Joint Test Action Group (JTAG) boundary-scan test (BST) circuitry complaint with IEEE Std. 1149.1-1990
1 t2 I& W  K  b  L. Q$ t ISP circuitry compliant with IEEE Std. 1532
# q! X% T+ v! d8 h5 O 3.3-V, 2.5-V, 1.8-V, 1.5-V LVCMOS and LVTTL standards7 @3 l5 C' A! Z# M2 c( T! m* e
 Emulated LVDS output (LVDS_E_3R)- s# _+ F3 T/ Y! `
 Emulated RSDS output (RSDS_E_3R)
' C8 g, `- K3 L* Q; c2 w1 E Operating junction temperature from -40 to 100 ℃7 K) R  f* z/ ^# E1 Z' S

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/ J2 P" o* ]. a3 C' v100 or 144 Pins for 256/272/576 LUTs2 s3 F$ {+ f  a* Z/ y! ]
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