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刚接触DSP28335，CCS5.3编程环境，XDS100v2下载器，同样的程序和配置连接下载一个老板没有问题，现在项目需要用了一个新板，但是连接测试错误，错误信息如下，求高手指教。, I, v- {5 {& O; Y! f" D1 b. h7 D
[Start]: H1 [" z4 _6 ^' Z+ ]
7 v5 S/ _- Z7 C( |( I" |Execute the command:" _: w0 p5 s+ h( Y3 H1 R
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%ccs_base%/common/uscif/dbgjtag -f %boarddatafile% -rv -o -F inform,logfile=yes -S pathlength -S integrity
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[Result]
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' c; A* N2 M; A-----[Print the board config pathname(s)]------------------------------------
# `0 Z3 _6 r* ~
9 {- h* m4 C# U! Y' D2 qC:\Users\ADMINI~1\AppData\Local\.ti\4084209646\
4 V, i& Y& w- t. t: G$ p7 H 0\0\BrdDat\testBoard.dat
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-----[Print the reset-command software log-file]-----------------------------' W; g" K+ G: K+ I% I5 L& y; M
: R9 @- u" t& w1 o2 _This utility has selected a 100- or 510-class product.% g. w6 O. Q+ b3 N1 D7 g5 b
This utility will load the adapter 'jioserdesusb.dll'.
+ b7 N, z r3 L' A! s6 d5 c# J; x ~The library build date was 'Oct 3 2012'.6 P: K# A7 \% ]
The library build time was '21:58:41'.
' h/ U3 ^2 q* y0 H$ y% i% @& c5 \0 JThe library package version is '5.0.872.0'.5 [; Y5 Y, G( w! U0 Y
The library component version is '35.34.40.0'.# N% D) A5 {' ?, \4 [1 Z
The controller does not use a programmable FPGA. o( _ ]; B! G( Y9 v' S9 Q
The controller has a version number of '4' (0x00000004).: e j, Y7 N: ~+ t2 }* q+ z
The controller has an insertion length of '0' (0x00000000).
, d' q4 P3 u$ w- a: G' N! e6 ]This utility will attempt to reset the controller.
' C3 E- I* b, F7 z6 `( c* }1 L$ iThis utility has successfully reset the controller.
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-----[Print the reset-command hardware log-file]-----------------------------
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/ i5 U$ W6 J1 O( m# jThe scan-path will be reset by toggling the JTAG TRST signal.6 s8 Z: J2 R" f
The controller is the FTDI FT2232 with USB inteRFace.' f3 K) \3 F1 A$ ~* Q X2 ^9 C
The link from controller to target is direct (without cable).$ r- _0 X4 V) L0 k$ F
The software is configured for FTDI FT2232 features.' w! w7 @% }" B# Y/ }
The controller cannot monitor the value on the EMU[0] pin.
; Y4 M) x3 z7 T0 [The controller cannot monitor the value on the EMU[1] pin.
- `2 h s1 C4 p. g+ sThe controller cannot control the timing on output pins.5 K4 I }; e; }
The controller cannot control the timing on input pins.
2 g2 M# A% Y9 b6 g8 sThe scan-path link-delay has been set to exactly '0' (0x0000).
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' q; M7 Q- n' w-----[The log-file for the JTAG TCLK output generated from the PLL]----------0 r# T8 w: K5 s6 S
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There is no hardware for programming the JTAG TCLK frequency.
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-----[Measure the source and frequency of the final JTAG TCLKR input]--------7 q2 d$ D; d {$ m, m; Z
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There is no hardware for measuring the JTAG TCLK frequency., E+ ?, F& Y; v
8 v- {& C1 A t$ R' ?6 N-----[Perform the standard path-length test on the JTAG IR and DR]-----------
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+ L7 P, y5 S# W/ M, i& `4 C3 dThis path-length test uses blocks of 512 32-bit words.
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The test for the JTAG IR instruction path-length faiLED.% h* M1 C* W9 W% U% M5 Z; Z! M) f
The many-ones then many-zeros tested length was 6 bits.) _4 `" ]2 n: E% a2 c& E
The many-zeros then many-ones tested length was -16352 bits.
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The test for the JTAG DR bypass path-length failed.4 ~ {, ^$ z4 S+ s3 I4 t* _3 A
The many-ones then many-zeros tested length was 8 bits.
6 I! o- w9 ~3 o1 X9 fThe many-zeros then many-ones tested length was -16352 bits.8 x9 D3 P$ _# x. v. T
/ |9 U% f& f- G, \ z-----[Perform the Integrity scan-test on the JTAG IR]------------------------( ?1 B+ j% j0 f4 ~7 ^8 x, y
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This test will use blocks of 512 32-bit words.
5 v `6 a9 a! oThis test will be applied just once.
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Do a test using 0xFFFFFFFF.# d* p5 k% D8 l( w% s
Scan tests: 1, skipped: 0, failed: 0% L- a6 p3 C' G# ~- U/ B
Do a test using 0x00000000.
) _$ i. x$ [2 i& e" C! ?1 {2 gTest 2 Word 0: scanned out 0x00000000 and scanned in 0x000000FF.
: D; `5 Y' [; ]" \( l( rScan tests: 2, skipped: 0, failed: 18 J& M/ l8 g& v6 p* f! b2 x: ]! Q' J
Do a test using 0xFE03E0E2.5 i0 p% L6 R/ ~* B2 X8 `, k: j
Test 3 Word 0: scanned out 0xFE03E0E2 and scanned in 0xFC1FE7FF.( Q9 `- A" I* @* X6 Q; @
Test 3 Word 1: scanned out 0xFE03E0E2 and scanned in 0xFC1FC7FF.
1 M# ?9 q- o) W! f; Q# j1 }+ yTest 3 Word 2: scanned out 0xFE03E0E2 and scanned in 0xFC1FE7FF.6 ]& Y5 u) L6 n& ]" ~ j" Z
Test 3 Word 3: scanned out 0xFE03E0E2 and scanned in 0xFC1FE7EF./ ?+ B/ i' P5 a# `9 P, N
Test 3 Word 4: scanned out 0xFE03E0E2 and scanned in 0xFC1FC7FF.3 V- j, }% P# j
Test 3 Word 5: scanned out 0xFE03E0E2 and scanned in 0xFC1FC3FF.
. Y* ]& z9 o5 O! v: cTest 3 Word 6: scanned out 0xFE03E0E2 and scanned in 0xFC0FE7FF.) f$ B3 j+ w9 F
The details of the first 8 errors have been provided.
( h2 t% X- G8 V. h }& U* x9 Z/ n3 t9 MThe utility will now report only the count of failed tests.
. s8 l# g6 v( \6 |/ b- d1 mScan tests: 3, skipped: 0, failed: 2
7 z9 A, I' g. ?2 `! i1 EDo a test using 0x01FC1F1D.
; S! N" n$ o/ Z+ RScan tests: 4, skipped: 0, failed: 3
$ X$ H6 t5 L! ~+ E7 g' aDo a test using 0x5533CCAA.
+ {( J2 P, \- ? a! }+ g" [, [Scan tests: 5, skipped: 0, failed: 47 V$ a% N& V \- X. D6 ?& f
Do a test using 0xAACC3355.5 T' x; x9 A7 ]6 w! T; D
Scan tests: 6, skipped: 0, failed: 58 f' @! h* n/ M3 I/ b: ^0 g
Some of the values were corrupted - 66.7 percent.
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4 p& l, n% h( K! W; y( _The JTAG IR Integrity scan-test has failed.
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2 o( B& F5 z! r+ R/ N4 c+ W, I. w-----[Perform the Integrity scan-test on the JTAG DR]------------------------) [/ ~" l C/ x2 p
; M }9 x+ k+ T4 n7 {This test will use blocks of 512 32-bit words.7 _ @+ g1 g$ _4 _+ v
This test will be applied just once.
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Do a test using 0xFFFFFFFF.
1 e& B. Q. l- d$ @. I2 w7 R5 KScan tests: 1, skipped: 0, failed: 0
& s- {+ W9 v; U. b k4 cDo a test using 0x00000000.
6 A* x( ?1 S9 g( L" N- P3 LTest 2 Word 0: scanned out 0x00000000 and scanned in 0x0000007F.1 `% |0 `- \& V* F
Scan tests: 2, skipped: 0, failed: 12 e# W* L0 J' x* }6 _) {
Do a test using 0xFE03E0E2.% P' V3 i" Z$ @3 C
Test 3 Word 0: scanned out 0xFE03E0E2 and scanned in 0xFC1FE7FF. {! u# x( Q) q, o' F
Test 3 Word 1: scanned out 0xFE03E0E2 and scanned in 0xFC3FE7FF.
/ W4 F( T$ U1 v& s/ W% ZTest 3 Word 2: scanned out 0xFE03E0E2 and scanned in 0xFC0FE7FF.
- q* o$ o% w: X9 u. w( \) fTest 3 Word 3: scanned out 0xFE03E0E2 and scanned in 0xFC3FE7FF.
. e5 S3 B# }% T; G8 QTest 3 Word 4: scanned out 0xFE03E0E2 and scanned in 0xFC1FC7FF.* R7 ]$ g, n' ]: e+ I p7 y
Test 3 Word 5: scanned out 0xFE03E0E2 and scanned in 0xFE1FE7FF." c; ?4 D1 E+ N0 E5 b
Test 3 Word 6: scanned out 0xFE03E0E2 and scanned in 0xFC1FE7FF.( `5 B3 I) U6 m, w+ t |0 [
The details of the first 8 errors have been provided.; o2 E y5 I# L6 ^, t
The utility will now report only the count of failed tests.
- D N0 M$ Q$ H- L+ gScan tests: 3, skipped: 0, failed: 2
3 i( \% R6 L" e2 v HDo a test using 0x01FC1F1D." f/ w, B% i4 v, c6 S3 a
Scan tests: 4, skipped: 0, failed: 3
! X, G/ a6 c; O% ?: \2 GDo a test using 0x5533CCAA.* h4 _ M2 f' c \/ c
Scan tests: 5, skipped: 0, failed: 4
' Z, O# ?( C; a% P- f( n8 Z" A0 ODo a test using 0xAACC3355.
+ k' ?4 a+ r0 h# ~- b' y4 AScan tests: 6, skipped: 0, failed: 5
1 Q" H1 S$ k- W5 M9 V5 B$ \Some of the values were corrupted - 66.7 percent.
+ r) b: }- u7 R6 I6 c: n$ h: J0 O+ A
The JTAG DR Integrity scan-test has failed.7 Q6 K1 r% H- M( g+ Z1 o
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发表于 2021-12-23 10:34
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