|
|
EDA365欢迎您登录！
您需要 登录 才可以下载或查看，没有帐号？注册
x
刚接触DSP28335，CCS5.3编程环境，XDS100v2下载器，同样的程序和配置连接下载一个老板没有问题，现在项目需要用了一个新板，但是连接测试错误，错误信息如下，求高手指教。
' O9 w* d0 b& w6 g% E* m6 b) n" r[Start]1 M) H, }5 l, u: Y
' v5 d) Q" `/ e* |" [8 A
Execute the command:
# _! Z: \6 M9 B& h. D1 k9 ]; X" X0 H9 M) P( `
%ccs_base%/common/uscif/dbgjtag -f %boarddatafile% -rv -o -F inform,logfile=yes -S pathlength -S integrity
t F$ s/ y& s2 ?& H1 b; w' M4 N0 ` @% {* ]7 v9 J3 J% N8 s4 }
[Result]
3 w" j5 |' T5 X" P
/ S% K0 S4 t7 Q
& P" n' \" b! X-----[Print the board config pathname(s)]------------------------------------, K5 a% @2 r- `+ F3 H, d. X
: l7 m" {" W7 @3 z3 B' m
C:\Users\ADMINI~1\AppData\Local\.ti\4084209646\
& n+ }2 l: M3 K 0\0\BrdDat\testBoard.dat
* j, x2 u+ J/ N. Z; x9 C6 h& n/ w' g. W8 q+ Y5 `6 @, l
-----[Print the reset-command software log-file]-----------------------------& V% v- U$ }$ x+ H3 y( n& E* I
" z( V# J% V! C
This utility has selected a 100- or 510-class product." P, ^/ g' i* K4 i( H8 w4 n% r: ^( ^
This utility will load the adapter 'jioserdesusb.dll'.
: ?( o8 L4 s5 g* L! G& FThe library build date was 'Oct 3 2012'.
5 H y+ ]* F% e0 t1 S* z/ v% l. qThe library build time was '21:58:41'.
1 u/ w6 B! ^# F2 O3 a" @The library package version is '5.0.872.0'.
+ D% Y+ E" W/ l, |, z5 OThe library component version is '35.34.40.0'.
8 _ K# {& D( r. o( HThe controller does not use a programmable FPGA.8 L7 }3 E$ _! Z
The controller has a version number of '4' (0x00000004).
" |' ^9 p4 A! l4 y. KThe controller has an insertion length of '0' (0x00000000).# ^) |$ f# K5 U8 M7 N7 X
This utility will attempt to reset the controller.! u2 o0 L. ~+ s+ r
This utility has successfully reset the controller.& [9 Q9 m7 o# T+ s) y. W
9 @3 P3 d5 k; q- c. N& {& M-----[Print the reset-command hardware log-file]-----------------------------
. I; X" z( V. q* V& P3 b$ j3 v- L3 H) }4 K* Y* j
The scan-path will be reset by toggling the JTAG TRST signal.; t V4 h4 ]8 \* C% ~" h# m
The controller is the FTDI FT2232 with USB inteRFace.
& d& H3 S. E: M% D% Y7 o" YThe link from controller to target is direct (without cable).: q* L( }4 M& ]9 R" n- r4 |4 j
The software is configured for FTDI FT2232 features.8 J1 k7 G9 u8 q
The controller cannot monitor the value on the EMU[0] pin.4 @( N9 ^( X# {* D E+ M8 q
The controller cannot monitor the value on the EMU[1] pin.
" l/ q- z2 P: e& q4 x. s# c* Q" H; pThe controller cannot control the timing on output pins.2 B8 w4 C( f" z0 c! @: E8 ]
The controller cannot control the timing on input pins.
( _' `/ ]* G, N+ j( u, T6 ?The scan-path link-delay has been set to exactly '0' (0x0000).
) ]6 D1 m' Z% K: R- d# k# g' |: P6 [& X1 _1 w% o2 y1 s
-----[The log-file for the JTAG TCLK output generated from the PLL]----------
' u; H. n U2 J$ C4 ~! O) C: ~- ?8 ^& n
There is no hardware for programming the JTAG TCLK frequency.
+ N6 A# r) q5 L; K$ G3 M; A& d. b3 t* b: p6 E
-----[Measure the source and frequency of the final JTAG TCLKR input]--------( N1 Y( e/ G+ m
+ I1 W0 a' Z, v( \) f- P
There is no hardware for measuring the JTAG TCLK frequency.0 t; y8 B/ ]) J6 U9 `3 n
* ^( e6 R! ]0 f- O" ?/ f
-----[Perform the standard path-length test on the JTAG IR and DR]-----------
+ U! m6 P6 S4 m9 Y3 x
" T p" K/ g+ @5 @8 r( @8 v# HThis path-length test uses blocks of 512 32-bit words.! H, t; I( ?+ ?4 T' G
$ g% J7 y7 }! X8 U( x8 g1 w
The test for the JTAG IR instruction path-length faiLED./ ~ j3 g. T& a9 ^! |% s
The many-ones then many-zeros tested length was 6 bits.
. Y: \& W% ~% eThe many-zeros then many-ones tested length was -16352 bits.
9 `; l$ @8 O; Q0 Z; H, w
8 V5 n4 G+ B/ J$ _1 BThe test for the JTAG DR bypass path-length failed.
8 b' L7 C$ b8 O0 G, iThe many-ones then many-zeros tested length was 8 bits.
% X7 ~' `5 J4 x, h& EThe many-zeros then many-ones tested length was -16352 bits.5 E# A3 t" o) {' t
2 I) R/ V7 _- ~/ }' J
-----[Perform the Integrity scan-test on the JTAG IR]------------------------9 Z# j a* G6 j ^# D. o
( O( v! V! G v' A6 T9 B' g; dThis test will use blocks of 512 32-bit words.% a( b, m5 P6 F4 x
This test will be applied just once.. s/ D, T P. A: s J2 N
) V8 s0 w X! s4 S+ p
Do a test using 0xFFFFFFFF.
! y* ?+ y, d: i l$ dScan tests: 1, skipped: 0, failed: 0
/ T' S9 E- Z' c+ s' yDo a test using 0x00000000.% a7 j! C. Q$ f5 ^( K) [
Test 2 Word 0: scanned out 0x00000000 and scanned in 0x000000FF.
6 Z7 m# w0 } U* F* RScan tests: 2, skipped: 0, failed: 11 }, c# k% p) W v, s: K! P
Do a test using 0xFE03E0E2.
* S% X- [; q# w) S9 r$ jTest 3 Word 0: scanned out 0xFE03E0E2 and scanned in 0xFC1FE7FF.
8 I+ _* q$ v. CTest 3 Word 1: scanned out 0xFE03E0E2 and scanned in 0xFC1FC7FF.
- X; N( }2 I1 |' f, e% yTest 3 Word 2: scanned out 0xFE03E0E2 and scanned in 0xFC1FE7FF.
; d/ O$ D4 S$ m0 W, D- I! V# ITest 3 Word 3: scanned out 0xFE03E0E2 and scanned in 0xFC1FE7EF.
5 h( y0 V$ Z/ i8 ^& g/ q( o. BTest 3 Word 4: scanned out 0xFE03E0E2 and scanned in 0xFC1FC7FF.
; `" ^! Y- i5 qTest 3 Word 5: scanned out 0xFE03E0E2 and scanned in 0xFC1FC3FF.
. v7 P' E9 f9 g- p5 f& xTest 3 Word 6: scanned out 0xFE03E0E2 and scanned in 0xFC0FE7FF.
5 {5 m# T; L( z6 `The details of the first 8 errors have been provided.
6 o% t" t! ^( F* A: U0 r) NThe utility will now report only the count of failed tests.
" P$ ~6 S# u9 oScan tests: 3, skipped: 0, failed: 24 U, D) _7 a0 h* F- j
Do a test using 0x01FC1F1D.8 k" V7 v5 R \$ |( C! ~
Scan tests: 4, skipped: 0, failed: 3
0 ~* n" R+ \ g1 B& FDo a test using 0x5533CCAA.. Y! u1 }; u5 O3 t; w- {$ O
Scan tests: 5, skipped: 0, failed: 4
3 V& h3 {+ [/ L8 |* x1 S* a+ LDo a test using 0xAACC3355.
9 |) l$ W3 i$ A3 q( L" Z7 RScan tests: 6, skipped: 0, failed: 5
7 F6 b' j4 M# r2 h% }( X% }+ S5 s+ NSome of the values were corrupted - 66.7 percent.3 S# M1 A& g) y0 U
9 J/ h; n9 N% X
The JTAG IR Integrity scan-test has failed.
8 ^/ j& V1 N8 V$ D& p n+ l* q/ p
0 t- a( \$ m& i' a-----[Perform the Integrity scan-test on the JTAG DR]------------------------
+ A- r7 J8 o; |$ j* a# N
4 w" k T9 L1 {0 N; V4 MThis test will use blocks of 512 32-bit words.
/ k1 a5 ?0 ^; O: jThis test will be applied just once.
# X3 J* h, ?- L& D% ^
% R3 P/ u1 Q: CDo a test using 0xFFFFFFFF.+ U: c n" m7 G4 [" i
Scan tests: 1, skipped: 0, failed: 0
+ N* N) e0 m) S! DDo a test using 0x00000000.
4 m: h2 A) m: [0 x1 j: M1 FTest 2 Word 0: scanned out 0x00000000 and scanned in 0x0000007F.
! L! Y1 P5 m2 o8 @Scan tests: 2, skipped: 0, failed: 11 F. _% D+ X5 k" q9 Q# V
Do a test using 0xFE03E0E2.
! H* f/ W! U; ]/ H. y. LTest 3 Word 0: scanned out 0xFE03E0E2 and scanned in 0xFC1FE7FF.8 x; d$ n U! e% B; Z
Test 3 Word 1: scanned out 0xFE03E0E2 and scanned in 0xFC3FE7FF.* K. S0 ~& N0 T, L
Test 3 Word 2: scanned out 0xFE03E0E2 and scanned in 0xFC0FE7FF.! w9 n( U& b3 s( Z0 U
Test 3 Word 3: scanned out 0xFE03E0E2 and scanned in 0xFC3FE7FF.3 w1 J3 X1 \# H/ x
Test 3 Word 4: scanned out 0xFE03E0E2 and scanned in 0xFC1FC7FF.
: U) U+ N k* B1 y, K% e5 hTest 3 Word 5: scanned out 0xFE03E0E2 and scanned in 0xFE1FE7FF.
* P4 M9 J, g$ b; J1 L0 n! x: wTest 3 Word 6: scanned out 0xFE03E0E2 and scanned in 0xFC1FE7FF.& k( ]/ B( L: E. J& p6 Z, f% n
The details of the first 8 errors have been provided.4 u- v: J/ H' x
The utility will now report only the count of failed tests.
6 v- c2 h3 d) q, M8 I$ UScan tests: 3, skipped: 0, failed: 2
, W7 g0 a+ T4 [ Z0 [, ? NDo a test using 0x01FC1F1D. x' f6 Q* d0 n
Scan tests: 4, skipped: 0, failed: 3! b8 |1 t2 q2 Y
Do a test using 0x5533CCAA.+ D4 L2 t/ R+ m/ v5 A, |' }
Scan tests: 5, skipped: 0, failed: 49 F4 E; B( E) a2 F1 v4 Y
Do a test using 0xAACC3355.% p2 t O) W* x' i5 J/ x! g1 X
Scan tests: 6, skipped: 0, failed: 5
0 }9 N' t$ |- M! Q6 m m CSome of the values were corrupted - 66.7 percent.
1 c! M% k6 P" i, `% I+ U4 b
. M7 z6 x( o7 A- e, j0 a BThe JTAG DR Integrity scan-test has failed.
1 n+ b7 T" z0 c3 `* h3 J r" f! N" w m& P R* Q% o" k# r" z+ m6 L& ]* L* A
|
|
/1 
发表于 2021-12-23 10:34
收藏
淘帖
支持！
反对！