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刚接触DSP28335，CCS5.3编程环境，XDS100v2下载器，同样的程序和配置连接下载一个老板没有问题，现在项目需要用了一个新板，但是连接测试错误，错误信息如下，求高手指教。, ~4 z9 k& c& l( {) q
[Start]
% q: U1 r" @! ]/ n4 y
" V6 l$ N9 \5 ?+ w( H" iExecute the command:
# X5 Z h) W, `3 b
$ Q; J' a z0 A3 T0 C" u% z* j# r%ccs_base%/common/uscif/dbgjtag -f %boarddatafile% -rv -o -F inform,logfile=yes -S pathlength -S integrity
$ I+ c7 O j3 q) q/ N( L9 _. K% f( c8 p
[Result]
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6 n0 `6 }/ _ G) W5 V2 T% O9 ~, N
-----[Print the board config pathname(s)]------------------------------------7 @5 o C# a1 J, M& [9 L
5 K+ D, {; I- R, qC:\Users\ADMINI~1\AppData\Local\.ti\4084209646\
2 h, K, `( e" Q7 ] B3 k3 b5 T8 c 0\0\BrdDat\testBoard.dat
W! y7 h2 K+ V; J) N& o( x
$ n& L0 P' f1 S( K. m-----[Print the reset-command software log-file]-----------------------------7 J" u0 g9 ]2 A
7 `2 O+ s4 f7 L! `% \6 J5 R
This utility has selected a 100- or 510-class product., ?' z5 f6 `0 `- w3 i- H* C. t
This utility will load the adapter 'jioserdesusb.dll'.
! C) P5 G/ m! p6 z# I. \The library build date was 'Oct 3 2012'.7 o1 W2 ^9 F; w7 ~
The library build time was '21:58:41'.
) V' F7 F6 L8 V* @ vThe library package version is '5.0.872.0'.
f$ d+ r% }; C% x* `7 |. HThe library component version is '35.34.40.0'.* E& B$ j7 m2 ~9 P, f9 a
The controller does not use a programmable FPGA.
; e, L) G1 Q: X; @2 [The controller has a version number of '4' (0x00000004).( G' _$ z, \" U4 J
The controller has an insertion length of '0' (0x00000000).1 w& w. I/ o4 g8 p8 A
This utility will attempt to reset the controller.
Y) S! ^9 I1 Z% W' Z2 JThis utility has successfully reset the controller.5 }) Q. [) n9 r# s; j5 t
, k7 D8 u7 g+ R/ A, Z$ ]! P-----[Print the reset-command hardware log-file]-----------------------------% |: N- v, B' m: s
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The scan-path will be reset by toggling the JTAG TRST signal.( k* @, N- l0 M* ]0 ^( f; g
The controller is the FTDI FT2232 with USB inteRFace.
3 A6 R, Q" g1 ]5 M' |The link from controller to target is direct (without cable).
6 q9 A6 b( }9 k# nThe software is configured for FTDI FT2232 features.
( w' {5 S6 t8 G, g. }6 O2 n* dThe controller cannot monitor the value on the EMU[0] pin.7 h5 k& \3 H ~3 K; g8 x
The controller cannot monitor the value on the EMU[1] pin.
$ K: A5 x/ S8 f2 e7 [% a% Z5 d eThe controller cannot control the timing on output pins.
5 H9 i# N* c% q( V. qThe controller cannot control the timing on input pins.
0 D5 w3 B3 H# g( v+ kThe scan-path link-delay has been set to exactly '0' (0x0000).
% c% [. u: g0 L' @
x; A% o& t$ \6 S" v-----[The log-file for the JTAG TCLK output generated from the PLL]----------
7 u# L1 o4 K# `) h7 Z r* H/ i1 `) B/ G L. ?6 ^% R+ K
There is no hardware for programming the JTAG TCLK frequency.
& ?1 q* P; m9 M4 i1 t4 K0 W( b% ?, W* ^0 u9 \
-----[Measure the source and frequency of the final JTAG TCLKR input]--------
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There is no hardware for measuring the JTAG TCLK frequency.
2 G# u1 a6 c) h8 a- o8 q5 E) F8 s2 I% v
4 T+ F0 |, x- x, X. F" V& W-----[Perform the standard path-length test on the JTAG IR and DR]-----------& @( g1 h. @5 k, e" ~; _
' V+ |1 P7 [& {
This path-length test uses blocks of 512 32-bit words.' _/ q6 e9 r0 \/ u; p! P
' V: e2 }3 w3 v) H5 m% A" gThe test for the JTAG IR instruction path-length faiLED.
- k1 b% [3 i& YThe many-ones then many-zeros tested length was 6 bits., V9 X3 d& e3 [/ h2 L" I; z9 }3 {
The many-zeros then many-ones tested length was -16352 bits./ d9 I2 x/ a( R& {2 ^; H8 K
: T8 \9 s2 B9 V% q
The test for the JTAG DR bypass path-length failed.; g, }7 N( p5 K% T: @
The many-ones then many-zeros tested length was 8 bits.
# V. }4 p' q9 p* q* hThe many-zeros then many-ones tested length was -16352 bits.
' w8 K9 p3 U' L- X/ p9 ?4 Q2 I( e3 j. o. J9 E
-----[Perform the Integrity scan-test on the JTAG IR]------------------------
% [- }- i) `" I' G& j8 C) U0 T. d$ S' e; X9 _* v
This test will use blocks of 512 32-bit words.5 b4 v# Y8 x: e& d
This test will be applied just once.! f1 \$ e; P) T5 O+ i+ _
5 E: D' @* V9 P( vDo a test using 0xFFFFFFFF.) @# _+ {8 d+ [6 R9 F6 C" y
Scan tests: 1, skipped: 0, failed: 08 C4 z! q3 D0 n: W" ~( b
Do a test using 0x00000000.; X4 x& n( H2 M2 V" _/ A) o
Test 2 Word 0: scanned out 0x00000000 and scanned in 0x000000FF.; e1 P3 ] T2 j/ q8 b
Scan tests: 2, skipped: 0, failed: 1; `+ f/ I( h. z, g
Do a test using 0xFE03E0E2.
8 R% K0 s, }5 d1 zTest 3 Word 0: scanned out 0xFE03E0E2 and scanned in 0xFC1FE7FF.
% F- h3 q5 R6 z7 `Test 3 Word 1: scanned out 0xFE03E0E2 and scanned in 0xFC1FC7FF.8 O. F: a9 I1 q0 o; h o5 s% _3 z
Test 3 Word 2: scanned out 0xFE03E0E2 and scanned in 0xFC1FE7FF.
6 n' k$ @4 j" ^3 I# _Test 3 Word 3: scanned out 0xFE03E0E2 and scanned in 0xFC1FE7EF.
) t; ^/ p$ t1 l' x: B( o! T% A& \! OTest 3 Word 4: scanned out 0xFE03E0E2 and scanned in 0xFC1FC7FF.. g: y; G: t$ q
Test 3 Word 5: scanned out 0xFE03E0E2 and scanned in 0xFC1FC3FF.
* H3 M# }/ f) P" [* }5 J; \Test 3 Word 6: scanned out 0xFE03E0E2 and scanned in 0xFC0FE7FF.4 D: O F- q5 e. t! Y! a
The details of the first 8 errors have been provided.
# Q k. l! b4 ~! b" `4 GThe utility will now report only the count of failed tests.
% U1 r( ^* z' S3 x0 \Scan tests: 3, skipped: 0, failed: 2
6 p$ v- l7 I: Y+ b! ~8 ?5 oDo a test using 0x01FC1F1D.
6 I" c0 o5 J5 b8 `Scan tests: 4, skipped: 0, failed: 3
1 J" ?; E1 F, j$ `) J: y3 ODo a test using 0x5533CCAA.
& h& n2 z( q: P1 h! v* _Scan tests: 5, skipped: 0, failed: 4: s- T, w- T7 L+ H
Do a test using 0xAACC3355.
6 m! s& P7 [: }. c8 yScan tests: 6, skipped: 0, failed: 5: M. Q( l, M# H% r/ ]2 j! {
Some of the values were corrupted - 66.7 percent.
8 k- S: }% c7 I. Q6 U% f) I- W9 `/ D2 L/ F/ T7 c
The JTAG IR Integrity scan-test has failed.
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-----[Perform the Integrity scan-test on the JTAG DR]------------------------
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This test will use blocks of 512 32-bit words.
2 ?1 C; I, g8 \0 q$ hThis test will be applied just once.
# Z6 z& x* X3 Q% t3 ]8 G
2 D& X. U7 ?7 j8 cDo a test using 0xFFFFFFFF.1 T' @: W/ i, U8 X9 ~9 d
Scan tests: 1, skipped: 0, failed: 09 c$ Z1 d/ o' ^! q
Do a test using 0x00000000.
( o, S u g# v. w+ `+ x; NTest 2 Word 0: scanned out 0x00000000 and scanned in 0x0000007F., `# t! i& d* p# C3 J
Scan tests: 2, skipped: 0, failed: 1$ b6 q: a9 ^, f' o1 h& C) q, V# l
Do a test using 0xFE03E0E2. U7 F1 Y5 j/ S5 ?
Test 3 Word 0: scanned out 0xFE03E0E2 and scanned in 0xFC1FE7FF.
4 U1 M* p, K5 b2 `( {' `2 h( Z) DTest 3 Word 1: scanned out 0xFE03E0E2 and scanned in 0xFC3FE7FF.; U$ p& z; l Z1 u% D, m8 S8 z
Test 3 Word 2: scanned out 0xFE03E0E2 and scanned in 0xFC0FE7FF.
, ^8 k4 @8 w/ @( S6 Y3 kTest 3 Word 3: scanned out 0xFE03E0E2 and scanned in 0xFC3FE7FF., c$ e( M9 Q5 ?! g0 D
Test 3 Word 4: scanned out 0xFE03E0E2 and scanned in 0xFC1FC7FF." p. J |! |: k$ V. V0 v) m7 S
Test 3 Word 5: scanned out 0xFE03E0E2 and scanned in 0xFE1FE7FF.7 Y* X. ?/ d! H4 R, V% e+ z" X
Test 3 Word 6: scanned out 0xFE03E0E2 and scanned in 0xFC1FE7FF.
9 u* P" s. V: }2 wThe details of the first 8 errors have been provided.
( r8 f5 f, I! zThe utility will now report only the count of failed tests.
4 f/ x6 O% F. l' f% M8 {+ q8 W. i" {Scan tests: 3, skipped: 0, failed: 2
+ @: |7 t$ R/ T. ?7 N( uDo a test using 0x01FC1F1D.; C' M' q( Q1 r8 Q0 `
Scan tests: 4, skipped: 0, failed: 31 |( a- Y& R! X) Q2 c, E
Do a test using 0x5533CCAA.- y7 l3 @9 Z0 I# y+ T
Scan tests: 5, skipped: 0, failed: 44 W- E: c8 u/ d% G
Do a test using 0xAACC3355.) u! \: P/ e6 }, u- A) a2 E
Scan tests: 6, skipped: 0, failed: 55 B* x( A) ?" m, v6 `
Some of the values were corrupted - 66.7 percent., B& O; B' P" ^3 I" M! ?" w
* @- }- q8 p/ d( QThe JTAG DR Integrity scan-test has failed.% f# M# O8 W$ T3 T
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发表于 2021-12-23 10:34
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