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刚接触DSP28335，CCS5.3编程环境，XDS100v2下载器，同样的程序和配置连接下载一个老板没有问题，现在项目需要用了一个新板，但是连接测试错误，错误信息如下，求高手指教。4 D+ e* M# @( O4 m
[Start]/ P# ]% `: B4 F9 |$ ^
0 o, ?, V9 j k% {/ V2 ^Execute the command:
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$ _" J" |0 ?" I" \9 a%ccs_base%/common/uscif/dbgjtag -f %boarddatafile% -rv -o -F inform,logfile=yes -S pathlength -S integrity8 ]% U1 o1 M' S! o% s w$ R( _
9 L# g6 _$ [; N1 ?# W4 w% j1 R
[Result]
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1 Q, O' a# n$ ?
5 X2 ^ I2 J% V, Q: F' {6 _, \-----[Print the board config pathname(s)]------------------------------------ D2 Q1 Y- b8 ^" }
8 E5 i# H" p3 j/ n8 ]6 G) QC:\Users\ADMINI~1\AppData\Local\.ti\4084209646\/ e! t" D3 r# y7 d$ { n
0\0\BrdDat\testBoard.dat6 X3 t$ k& \8 E4 Y9 T
! M- U8 h# Z# j9 w6 {+ U; G, w* G
-----[Print the reset-command software log-file]-----------------------------
/ [+ h: d. m, q; }7 W
7 P2 J4 w( x' |+ S8 Q% e. oThis utility has selected a 100- or 510-class product.
4 K0 r9 n* A5 V, Z" B3 y2 wThis utility will load the adapter 'jioserdesusb.dll'.1 \0 y7 M7 d( J
The library build date was 'Oct 3 2012'.) b/ g& _7 P0 o6 H0 R
The library build time was '21:58:41'.
4 b% o' n7 H) `6 I' U9 _4 _2 dThe library package version is '5.0.872.0'.
U; A( _! W F0 a$ t! oThe library component version is '35.34.40.0'.' }7 l& k9 @6 q2 }- _
The controller does not use a programmable FPGA.; {2 C1 i, q( c$ r0 q3 i+ w3 [1 e
The controller has a version number of '4' (0x00000004).
7 R0 m, }3 x* D7 KThe controller has an insertion length of '0' (0x00000000).
% ]. p" l7 H" H8 w6 ^: vThis utility will attempt to reset the controller.
+ w5 v9 M; E8 B( A' ~This utility has successfully reset the controller.
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, ]$ s3 }3 W/ }9 }1 W6 B6 O" b- S# R-----[Print the reset-command hardware log-file]-----------------------------
8 ~2 y7 I | P; w2 I: k
& _7 H# t' r5 N8 X0 VThe scan-path will be reset by toggling the JTAG TRST signal.
0 l( L# U J( y6 [1 _" d& ?1 mThe controller is the FTDI FT2232 with USB inteRFace.
$ k/ ?9 R0 C5 t. MThe link from controller to target is direct (without cable).5 J2 d; b4 ]+ e/ j: J7 p
The software is configured for FTDI FT2232 features.& Y+ T; T# n0 K
The controller cannot monitor the value on the EMU[0] pin.
" ~) l, @9 K+ L8 g6 L# m# ZThe controller cannot monitor the value on the EMU[1] pin.
1 o" q) I. `! t* h6 u0 s/ ` CThe controller cannot control the timing on output pins." M3 W& R9 R ~! L
The controller cannot control the timing on input pins.
: J- W* m4 O% y; VThe scan-path link-delay has been set to exactly '0' (0x0000).
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-----[The log-file for the JTAG TCLK output generated from the PLL]----------
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There is no hardware for programming the JTAG TCLK frequency.
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-----[Measure the source and frequency of the final JTAG TCLKR input]--------; D' @( e5 M9 } R" I/ v, a4 e
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There is no hardware for measuring the JTAG TCLK frequency.
% _+ j+ y& a0 ?2 w( @# ~5 ]& \8 j/ `5 j1 m
-----[Perform the standard path-length test on the JTAG IR and DR]-----------
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This path-length test uses blocks of 512 32-bit words.7 X6 k9 T0 f$ u, x! J
9 h) f% d% c4 s3 G" R' |The test for the JTAG IR instruction path-length faiLED.
1 g" ~4 i( p4 R8 O* ]0 kThe many-ones then many-zeros tested length was 6 bits.
; P' p3 h; H/ L8 \" z# `% _( XThe many-zeros then many-ones tested length was -16352 bits.
1 V% \1 y5 _: H5 ?' I4 @
) V( ]; s8 U$ X: V( D" b' LThe test for the JTAG DR bypass path-length failed.+ ]/ m! c8 a2 V( |6 U$ Y
The many-ones then many-zeros tested length was 8 bits.
9 S! a8 R) R ^; }1 _0 l5 ]The many-zeros then many-ones tested length was -16352 bits. |% a7 c0 o/ a, k% C' [1 k8 A Q
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-----[Perform the Integrity scan-test on the JTAG IR]------------------------. ^9 u: G! f ]' p- V& W
3 m8 v9 z: U- t; Z& _This test will use blocks of 512 32-bit words.$ x, E% E+ Y7 m3 h/ v d. ], g
This test will be applied just once.
. U$ A% t! N; U ]( S/ r
; d' z5 Q6 J0 ]: {2 c. gDo a test using 0xFFFFFFFF.
! D7 E, c: Z5 D0 r* _4 wScan tests: 1, skipped: 0, failed: 0
. Z& ~% D' o! }0 p" SDo a test using 0x00000000.! X& ]: n. E) g% M1 x0 @$ g- R
Test 2 Word 0: scanned out 0x00000000 and scanned in 0x000000FF.9 i0 K7 s& k, P; q6 A! g
Scan tests: 2, skipped: 0, failed: 1" \, a1 ^& X5 n8 B7 F) k
Do a test using 0xFE03E0E2.
0 j V) S5 @& @$ Z& K; v% UTest 3 Word 0: scanned out 0xFE03E0E2 and scanned in 0xFC1FE7FF.
; [5 a7 r" h2 D# j3 `7 ` w6 eTest 3 Word 1: scanned out 0xFE03E0E2 and scanned in 0xFC1FC7FF.
5 ^+ ?- y4 a. W; s/ G7 NTest 3 Word 2: scanned out 0xFE03E0E2 and scanned in 0xFC1FE7FF.5 \8 C5 z2 Y) M2 B9 A( y
Test 3 Word 3: scanned out 0xFE03E0E2 and scanned in 0xFC1FE7EF.
- _3 B' s9 P# l0 l5 Z/ _Test 3 Word 4: scanned out 0xFE03E0E2 and scanned in 0xFC1FC7FF.
8 z! T- R& \; x8 N& dTest 3 Word 5: scanned out 0xFE03E0E2 and scanned in 0xFC1FC3FF.: s# _% D. l' U* K. |9 j+ \
Test 3 Word 6: scanned out 0xFE03E0E2 and scanned in 0xFC0FE7FF.2 m, B4 H& G; F5 I
The details of the first 8 errors have been provided.
2 }2 [' x! v: r. m0 d8 ?The utility will now report only the count of failed tests.9 u4 Y3 ~$ \+ p: p3 u v2 b
Scan tests: 3, skipped: 0, failed: 27 g" U- Q4 o0 n. } G' d* p
Do a test using 0x01FC1F1D., l0 b2 p1 J+ B$ ?
Scan tests: 4, skipped: 0, failed: 3
$ U! q6 C# g9 D, m; JDo a test using 0x5533CCAA.
" V S2 Y; G! e" x$ k) dScan tests: 5, skipped: 0, failed: 4
/ D6 c1 }. {7 {* B; }Do a test using 0xAACC3355.- {; z0 f$ Q& z6 n% y1 w, V
Scan tests: 6, skipped: 0, failed: 5+ m7 T: B4 L4 s/ c, h% v# B
Some of the values were corrupted - 66.7 percent.# r5 V* X. ?4 A- M$ _$ e$ o$ r
4 D; `3 j7 M# z; ^1 H
The JTAG IR Integrity scan-test has failed. B" B( o/ G0 u8 U. [. g
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-----[Perform the Integrity scan-test on the JTAG DR]------------------------
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! `% x/ ]) J/ d8 F' CThis test will use blocks of 512 32-bit words.
, r T; e1 `/ F, yThis test will be applied just once.
b% s9 H' A. b2 O, m" L7 R6 u( P3 G7 g! |5 d9 `8 f2 w2 d
Do a test using 0xFFFFFFFF.
/ J6 W4 U. n2 [3 x* `Scan tests: 1, skipped: 0, failed: 03 F( @3 K2 K4 S! M6 N& C$ X! W
Do a test using 0x00000000.$ C) w& _1 [/ ?5 h, B; }. p
Test 2 Word 0: scanned out 0x00000000 and scanned in 0x0000007F." J1 H: g% D3 a( F; P6 y/ X5 c
Scan tests: 2, skipped: 0, failed: 1
' K0 U/ ]. F( n% Z3 @: z; @! w/ R8 \Do a test using 0xFE03E0E2.' c, Y$ O- n( @5 D6 N1 {
Test 3 Word 0: scanned out 0xFE03E0E2 and scanned in 0xFC1FE7FF.
% n! F. L+ T+ O3 [4 ?6 n3 x: z: _Test 3 Word 1: scanned out 0xFE03E0E2 and scanned in 0xFC3FE7FF.
" y1 j! T( d3 kTest 3 Word 2: scanned out 0xFE03E0E2 and scanned in 0xFC0FE7FF.
; b7 W: E' m- ~" I, A1 A5 HTest 3 Word 3: scanned out 0xFE03E0E2 and scanned in 0xFC3FE7FF.
* }# B& y/ s2 L2 i l! fTest 3 Word 4: scanned out 0xFE03E0E2 and scanned in 0xFC1FC7FF.
3 l M2 i# }9 Y- b4 @! f! i6 p& [Test 3 Word 5: scanned out 0xFE03E0E2 and scanned in 0xFE1FE7FF.
! u7 w/ G& u5 y% a6 j) KTest 3 Word 6: scanned out 0xFE03E0E2 and scanned in 0xFC1FE7FF.
& |3 p( q+ \6 H5 LThe details of the first 8 errors have been provided.' ^6 E; u( `* v: N6 {9 x
The utility will now report only the count of failed tests.' V8 z1 S6 ]& ]0 S
Scan tests: 3, skipped: 0, failed: 29 q1 o# J J a! w: d0 T- P
Do a test using 0x01FC1F1D.
2 [8 A9 g. _% N: mScan tests: 4, skipped: 0, failed: 3
$ @% H, W& C6 [1 {% \3 lDo a test using 0x5533CCAA.
4 g2 {* Z' V! j' e `7 lScan tests: 5, skipped: 0, failed: 4
! D" v5 z a4 J2 ~ J' `Do a test using 0xAACC3355.
7 W2 L3 u6 L3 z* V0 Y. ]: EScan tests: 6, skipped: 0, failed: 5
9 j% z h; y: [5 x0 h3 c$ mSome of the values were corrupted - 66.7 percent.
; W7 V3 F2 c9 {5 _( ?0 B, P# V
The JTAG DR Integrity scan-test has failed. O! o+ k9 k& ^9 D8 v( j
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发表于 2021-12-23 10:34
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