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混合信号测量
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# I# s; d8 U% n8 w内容并不限于混合信号系统测试，而是一般芯片或模块测试的全过程，只是以ADC和DAC为例说明芯片外特性测试的全过程。本章更多地是讲测试中的数据处理方法，间或涉及到测试电路, o. R& _% I3 Z9 C0 ^
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„ I. What is Mixed Signal. t* U3 C. L# E1 I
„ II. Mixed Signal Test Parameters
- v1 f# E( T9 [0 m7 k+ C„ III. Signal Generation
: H- o( P$ @7 n- J( y„ IV. Signal Capture" M! l2 [) i# n0 U" p$ d }/ Y
„ V. Fast Fourier Transform. @% L1 c: F) G* |4 C" K. Q2 t, R, N
„ VI. Testing Digital-to-Analog Converters! C- h2 n; M0 c" f/ c# d8 v9 ~$ v, B
„ VII. Testing Analog-to-Digital Converters7 L; Q2 B. l [& h/ q( I& i
! V: m( @; h+ b! A4 D' R7 M, I, N/ x„ Music CD# t, y, `" O* C8 L+ z
„ Analog information is processed in digital form+ W. V! a, u1 f a: ]0 E
„ Modem% P3 S6 i% E5 @, @
„ Digital information is processed in analog form9 T( [* R# p) [. d$ F% _
„ Mixed Signal System, N1 z& ]& J, c* ?% H
„ Processes analog information in digital form; or
, R! Y' d8 L, z- f" B. ^„ Processes digital information in analog form; or
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„ Mixed Signal Device: O; [) p3 _0 H1 H
„ Operates across digital and analog domains by representing
j( y& [% S9 r, |; ]" {+ Jor processing either analog or digital information in either
$ v" @$ P. |# |6 N- Danalog or digital form
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发表于 2019-11-26 15:06
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